High energy irradiation effects on silicon photonic passive devices.

In this work, the radiation responses of silicon photonic passive devices built in silicon-on-insulator (SOI) technology are investigated through high energy neutron and 60Co γ-ray irradiation. The wavelengths of both micro-ring resonators (MRRs) and Mach-Zehnder interferometers (MZIs) exhibit blue shifts after high-energy neutron irradiation to a fluence of 1×1012 n/cm2; the blue shift is smaller in MZI devices than in MRRs due to different waveguide widths. Devices with SiO2 upper cladding layer show strong tolerance to irradiation. Neutron irradiation leads to slight changes in the crystal symmetry in the Si cores of the optical devices and accelerated oxidization for devices without SiO2 cladding. A 2-µm top cladding of SiO2 layer significantly improves the radiation tolerance of these passive photonic devices.

Radiation-hardened silicon photonic passive devices on a 3 µm waveguide platform under gamma and proton irradiation.

Silicon photonics is considered to be an ideal solution as optical interconnect in radiation environments. Our previous study has demonstrated experimentally that radiation responses of device are related to waveguide size, and devices with thick top silicon waveguide layers are expected to be less sensitive to irradiation. Here, we design radiation-resistant arrayed waveguide gratings and Mach-Zehnder interferometers based on silicon-on-insulator with 3 µm-thick silicon optical waveguide platform. The devices are exposed to 60Co γ-ray irradiation up to 41 Mrad(Si) and 170-keV proton irradiation with total fluences from 1×1013 to 1×1016 p/cm2 to evaluate performance after irradiation. The results show that these devices can function well and have potential application in harsh radiation environments.

Low-frequency noise in nanowires.

40 years of research on low-frequency (LF) noise and random-telegraph noise (RTN) in metallic and semiconducting nanowires (NWs) demonstrate the importance of defects and impurities to each system. The fluctuating interference of electrons in the local environment of a mobile bulk defect or impurity can lead to LF noise, RTN, and device-to-device variations in metallic and semiconducting NWs. Scattering centers leading to mobility fluctuations in semiconducting NWs include random dopant atoms and bulk defect clusters. Effective energy distributions for the relevant defects and impurities can be obtained from noise versus temperature measurements in conjunction with the Dutta-Horn model of LF noise for both metallic and semiconducting NWs. In semiconducting NWs configured as metal-oxide-semiconductor field-effect transistors, fluctuations in carrier number due to charge exchange with border traps, such as oxygen vacancies and/or their complexes with hydrogen in adjacent or surrounding dielectrics, often dominate or add to bulk noise sources.

Influence of Ionizing Radiation and the Role of Thiol Ligands on the Reversible Photodarkening of CdTe/CdS Quantum Dots.

We investigate the influence of high energy photons and thiol ligands on the photophysical properties of sub-monolayer CdTe/CdS quantum dots (QDs) immobilized in porous silica (PSiO2) scaffolds. The highly disperse, uniform distributions of QDs in a three-dimensional PSiO2 framework ensure uniform interaction of not only radiation but also subsequent surface repassivation solutions to all immobilized QDs. The high optical densities of QDs achieved using PSiO2 enable straightforward monitoring of the QD photoluminescence intensities and carrier lifetimes. Irradiation of QDs in PSiO2 by high energy photons, X-rays, and γ-rays leads to dose-dependent QD photodarkening, which is accompanied by accelerated photooxidative effects in ambient environments that give rise to blue-shifts in the peak QD emission wavelength. Irradiation in an oxygen-free environment also leads to QD photodarkening but with no accompanying blue-shift of the QD emission. Significant reversal of QD photodarkening is demonstrated following QD surface repassivation with a solution containing free-thiols, suggesting reformation of a CdS shell, etching of surface oxidized species, and possible reduction of photoionized dark QDs to a neutral, bright state. Permanent lattice displacement damage effects may contribute toward some irreversible γ radiation damage. This work contributes to an improved understanding of the influence of surface ligands on the optical properties of QDs and opens up the possibilities of engineering large area, low-cost, reuseable, and flexible QD-based optical radiation sensors.