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Microstructural origin of resistance-strain hysteresis in carbon nanotube thin film conductors.
Jin, Lihua; Chortos, Alex; Lian, Feifei; Pop, Eric; Linder, Christian; Bao, Zhenan; Cai, Wei.
Afiliación
  • Jin L; Department of Civil and Environmental Engineering, Stanford University, Stanford, CA 94305.
  • Chortos A; Department of Mechanical and Aerospace Engineering, University of California, Los Angeles, CA 90095.
  • Lian F; Department of Chemical Engineering, Stanford University, Stanford, CA 94305.
  • Pop E; Department of Electrical Engineering, Stanford University, Stanford, CA 94305.
  • Linder C; Department of Electrical Engineering, Stanford University, Stanford, CA 94305.
  • Bao Z; Department of Civil and Environmental Engineering, Stanford University, Stanford, CA 94305.
  • Cai W; Department of Chemical Engineering, Stanford University, Stanford, CA 94305.
Proc Natl Acad Sci U S A ; 115(9): 1986-1991, 2018 02 27.
Article en En | MEDLINE | ID: mdl-29440431
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Texto completo: 1 Banco de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Proc Natl Acad Sci U S A Año: 2018 Tipo del documento: Article
Texto completo
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XML
PubMed Links
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Texto completo: 1 Banco de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Proc Natl Acad Sci U S A Año: 2018 Tipo del documento: Article