Characterization of Spatial Distribution of Trap Across the Substrate in Metal-Insulator-Semiconductor Structure with Band Bending Effect.

Yu, Jintae; Yoo, Han Bin; Kim, Hae Sung; Ryu, Ji Hee; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong.

Afiliación

Yu J; School of Electrical Engineering, Kookmin University, Seoul 02701, Korea.
Yoo HB; School of Electrical Engineering, Kookmin University, Seoul 02701, Korea.
Kim HS; School of Electrical Engineering, Kookmin University, Seoul 02701, Korea.
Ryu JH; School of Electrical Engineering, Kookmin University, Seoul 02701, Korea.
Choi SJ; School of Electrical Engineering, Kookmin University, Seoul 02701, Korea.
Kim DH; School of Electrical Engineering, Kookmin University, Seoul 02701, Korea.
Kim DM; School of Electrical Engineering, Kookmin University, Seoul 02701, Korea.

J Nanosci Nanotechnol ; 21(8): 4315-4319, 2021 Aug 01.

Article en En | MEDLINE | ID: mdl-33714320

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Revista: J Nanosci Nanotechnol Año: 2021 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Revista: J Nanosci Nanotechnol Año: 2021 Tipo del documento: Article