Edge State, Localization Length, and Critical Exponent from Survival Probability in Topological Waveguides.

Wang, Li-Cheng; Chen, Yang; Gong, Ming; Yu, Feng; Chen, Qi-Dai; Tian, Zhen-Nan; Ren, Xi-Feng; Sun, Hong-Bo

Wang, Li-Cheng; Chen, Yang; Gong, Ming; Yu, Feng; Chen, Qi-Dai; Tian, Zhen-Nan; Ren, Xi-Feng; Sun, Hong-Bo.

Afiliación

Wang LC; State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China.
Chen Y; CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China.
Gong M; CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China.
Yu F; Hefei National Laboratory, University of Science and Technology of China, Hefei 230088, China.
Chen QD; CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China.
Tian ZN; CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China.
Ren XF; Hefei National Laboratory, University of Science and Technology of China, Hefei 230088, China.
Sun HB; State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China.

Phys Rev Lett ; 129(17): 173601, 2022 Oct 21.

Article en En | MEDLINE | ID: mdl-36332264

Asunto(s)

Probabilidad; Transición de Fase

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Texto completo: 1 Banco de datos: MEDLINE Asunto principal: Probabilidad Idioma: En Revista: Phys Rev Lett Año: 2022 Tipo del documento: Article País de afiliación: China

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