High resolution capabilities of all-silica cantilevered probes for near-field optical microscopy.

Descrovi, Emiliano; Aeschimann, Laure; Soboleva, Irina; De Angelis, Francesco; Giorgis, Fabrizio; Di Fabrizio, Enzo

Descrovi, Emiliano; Aeschimann, Laure; Soboleva, Irina; De Angelis, Francesco; Giorgis, Fabrizio; Di Fabrizio, Enzo.

Affiliation

Descrovi E; Materials and Microsystems Laboratory-xLab, Politecnico di Torino, C. so Duca degli Abruzzi 24, 10129 Torino, Italy

J Nanosci Nanotechnol ; 9(11): 6460-4, 2009 Nov.

Article in En | MEDLINE | ID: mdl-19908549

Subject(s)

Image Enhancement/instrumentation; Microscopy, Scanning Probe/instrumentation; Nanotechnology/instrumentation; Silicon Dioxide/chemistry; Transducers; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Reproducibility of Results; Sensitivity and Specificity

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Collection: 01-internacional Database: MEDLINE Main subject: Transducers / Image Enhancement / Silicon Dioxide / Microscopy, Scanning Probe / Nanotechnology Type of study: Diagnostic_studies Language: En Journal: J Nanosci Nanotechnol Year: 2009 Type: Article Affiliation country: Italy

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