Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique.
Opt Express
; 18(25): 26625-30, 2010 Dec 06.
Article
in En
| MEDLINE
| ID: mdl-21165011
ABSTRACT
We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive waves emitted by solitons into the wavelength range of normal group velocity dispersion.
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Main subject:
Refractometry
/
Silicon
/
Data Interpretation, Statistical
/
Models, Statistical
Type of study:
Risk_factors_studies
Language:
En
Journal:
Opt Express
Journal subject:
OFTALMOLOGIA
Year:
2010
Type:
Article
Affiliation country:
United kingdom