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Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique.
Ding, W; Gorbach, A V; Wadswarth, W J; Knight, J C; Skryabin, D V; Strain, M J; Sorel, M; De La Rue, R M.
Affiliation
  • Ding W; Centre for Photonics and Photonic Materials, Department of Physics, University of Bath, Bath BA2 7AY, United Kingdom. w.ding@bath.ac.uk
Opt Express ; 18(25): 26625-30, 2010 Dec 06.
Article in En | MEDLINE | ID: mdl-21165011
ABSTRACT
We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive waves emitted by solitons into the wavelength range of normal group velocity dispersion.
Subject(s)

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Refractometry / Silicon / Data Interpretation, Statistical / Models, Statistical Type of study: Risk_factors_studies Language: En Journal: Opt Express Journal subject: OFTALMOLOGIA Year: 2010 Type: Article Affiliation country: United kingdom

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Refractometry / Silicon / Data Interpretation, Statistical / Models, Statistical Type of study: Risk_factors_studies Language: En Journal: Opt Express Journal subject: OFTALMOLOGIA Year: 2010 Type: Article Affiliation country: United kingdom