Your browser doesn't support javascript.
loading
Current-limiting challenges for all-spin logic devices.
Su, Li; Zhang, Youguang; Klein, Jacques-Olivier; Zhang, Yue; Bournel, Arnaud; Fert, Albert; Zhao, Weisheng.
Affiliation
  • Su L; Fert Beijing Institute, Univ. Beihang, 100191, Beijing, China.
  • Zhang Y; School of Electrical &Information Engineering, Beihang Univ, Beijing 100191, Peoples R China.
  • Klein JO; Institut d'Electronique Fondamentale, Univ. Paris-Sud, F-91405 Orsay, France.
  • Zhang Y; UMR 8622, CNRS, F-91405 Orsay, France.
  • Bournel A; Fert Beijing Institute, Univ. Beihang, 100191, Beijing, China.
  • Fert A; School of Electrical &Information Engineering, Beihang Univ, Beijing 100191, Peoples R China.
  • Zhao W; Institut d'Electronique Fondamentale, Univ. Paris-Sud, F-91405 Orsay, France.
Sci Rep ; 5: 14905, 2015 Oct 09.
Article in En | MEDLINE | ID: mdl-26449410
Fulltext
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: Sci Rep Year: 2015 Type: Article Affiliation country: China
Fulltext
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: Sci Rep Year: 2015 Type: Article Affiliation country: China