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Alloyed 2D Metal-Semiconductor Atomic Layer Junctions.
Kim, Ah Ra; Kim, Yonghun; Nam, Jaewook; Chung, Hee-Suk; Kim, Dong Jae; Kwon, Jung-Dae; Park, Sang Won; Park, Jucheol; Choi, Sun Young; Lee, Byoung Hun; Park, Ji Hyeon; Lee, Kyu Hwan; Kim, Dong-Ho; Choi, Sung Mook; Ajayan, Pulickel M; Hahm, Myung Gwan; Cho, Byungjin.
Affiliation
  • Kim AR; Department of Advanced Functional Thin Films, Surface Technology Division, Korea Institute of Materials Science , 797 Changwondaero, Sungsan-Gu, Changwon, Gyeongnam 51508, Republic of Korea.
  • Kim Y; Department of Advanced Functional Thin Films, Surface Technology Division, Korea Institute of Materials Science , 797 Changwondaero, Sungsan-Gu, Changwon, Gyeongnam 51508, Republic of Korea.
  • Nam J; School of Materials Science and Engineering, Gwanju Institute of Science and Technology (GIST) , 261 Cheomdan-gwangiro, Buk-Gu, Gwangju 61005, Republic of Korea.
  • Chung HS; School of Chemical Engineering, Sungkyunkwan University , 300 Cheongcheon-dong, Suwon, Gyeonggi-do 16419, Republic of Korea.
  • Kim DJ; Jeonju Center, Korea Basic Science Institute , Jeonju, Jeollabuk-do 54907, Republic of Korea.
  • Kwon JD; School of Chemical Engineering, Sungkyunkwan University , 300 Cheongcheon-dong, Suwon, Gyeonggi-do 16419, Republic of Korea.
  • Park SW; Department of Advanced Functional Thin Films, Surface Technology Division, Korea Institute of Materials Science , 797 Changwondaero, Sungsan-Gu, Changwon, Gyeongnam 51508, Republic of Korea.
  • Park J; Department of Advanced Functional Thin Films, Surface Technology Division, Korea Institute of Materials Science , 797 Changwondaero, Sungsan-Gu, Changwon, Gyeongnam 51508, Republic of Korea.
  • Choi SY; Structure Analysis Group, Gyeongbuk Science & Technology Promotion Center, Future Strategy Research Institute , 17 Cheomdangieop 1-ro, Sangdong-myeon, Gumi, Gyeongbuk 39171, Republic of Korea.
  • Lee BH; Department of Advanced Functional Thin Films, Surface Technology Division, Korea Institute of Materials Science , 797 Changwondaero, Sungsan-Gu, Changwon, Gyeongnam 51508, Republic of Korea.
  • Park JH; School of Materials Science and Engineering, Gwanju Institute of Science and Technology (GIST) , 261 Cheomdan-gwangiro, Buk-Gu, Gwangju 61005, Republic of Korea.
  • Lee KH; Department of Electricity and Electronic Engineering, University of Ulsan , 93 Daehak-ro, Nam-gu, Ulsan 44610, Republic of Korea.
  • Kim DH; Electrochemistry Department, Surface Technology Division, Korea Institute of Materials Science (KIMS) , 797 Changwondaero, Sungsan-gu, Changwon, Gyeongnam 51508, Republic of Korea.
  • Choi SM; Department of Advanced Functional Thin Films, Surface Technology Division, Korea Institute of Materials Science , 797 Changwondaero, Sungsan-Gu, Changwon, Gyeongnam 51508, Republic of Korea.
  • Ajayan PM; Electrochemistry Department, Surface Technology Division, Korea Institute of Materials Science (KIMS) , 797 Changwondaero, Sungsan-gu, Changwon, Gyeongnam 51508, Republic of Korea.
  • Hahm MG; Department of Materials Science and NanoEngineering, Rice University , 6100 Main Street, Houston, Texas 77005, United States .
  • Cho B; School of Materials Science and Engineering, Inha University , 100 Inharo, Nam-Gu, Incheon 22212, Republic of Korea.
Nano Lett ; 16(3): 1890-5, 2016 Mar 09.
Article in En | MEDLINE | ID: mdl-26839956
ABSTRACT
Heterostructures of compositionally and electronically variant two-dimensional (2D) atomic layers are viable building blocks for ultrathin optoelectronic devices. We show that the composition of interfacial transition region between semiconducting WSe2 atomic layer channels and metallic NbSe2 contact layers can be engineered through interfacial doping with Nb atoms. WxNb1-xSe2 interfacial regions considerably lower the potential barrier height of the junction, significantly improving the performance of the corresponding WSe2-based field-effect transistor devices. The creation of such alloyed 2D junctions between dissimilar atomic layer domains could be the most important factor in controlling the electronic properties of 2D junctions and the design and fabrication of 2D atomic layer devices.
Key words

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nano Lett Year: 2016 Type: Article

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nano Lett Year: 2016 Type: Article