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Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction.
Carvalho, Daniel; Müller-Caspary, Knut; Schowalter, Marco; Grieb, Tim; Mehrtens, Thorsten; Rosenauer, Andreas; Ben, Teresa; García, Rafael; Redondo-Cubero, Andrés; Lorenz, Katharina; Daudin, Bruno; Morales, Francisco M.
Affiliation
  • Carvalho D; Department of Materials Science and Metallurgic Engineering, and Inorganic Chemistry, Faculty of Sciences, University of Cádiz, Spain.
  • Müller-Caspary K; IMEYMAT: Institute of Research on Electron Microscopy and Materials of the University of Cádiz, Spain.
  • Schowalter M; Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany.
  • Grieb T; Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany.
  • Mehrtens T; Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany.
  • Rosenauer A; Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany.
  • Ben T; Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany.
  • García R; Department of Materials Science and Metallurgic Engineering, and Inorganic Chemistry, Faculty of Sciences, University of Cádiz, Spain.
  • Redondo-Cubero A; IMEYMAT: Institute of Research on Electron Microscopy and Materials of the University of Cádiz, Spain.
  • Lorenz K; Department of Materials Science and Metallurgic Engineering, and Inorganic Chemistry, Faculty of Sciences, University of Cádiz, Spain.
  • Daudin B; IMEYMAT: Institute of Research on Electron Microscopy and Materials of the University of Cádiz, Spain.
  • Morales FM; IPFN, Instituto Superior Técnico, Campus Tecnológico e Nuclear, Universidade de Lisboa, 2695-066 Bobadela LRS, Portugal.
Sci Rep ; 6: 28459, 2016 06 28.
Article in En | MEDLINE | ID: mdl-27350322
The built-in piezoelectric fields in group III-nitrides can act as road blocks on the way to maximizing the efficiency of opto-electronic devices. In order to overcome this limitation, a proper characterization of these fields is necessary. In this work nano-beam electron diffraction in scanning transmission electron microscopy mode has been used to simultaneously measure the strain state and the induced piezoelectric fields in a GaN/AlN multiple quantum well system.
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sci Rep Year: 2016 Type: Article Affiliation country: Spain
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PubMed Links
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sci Rep Year: 2016 Type: Article Affiliation country: Spain