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Unexpected benefits of stacking faults on the electronic structure and optical emission in wurtzite GaAs/GaInP core/shell nanowires.
Yuan, Xiaoming; Li, Lin; Li, Ziyuan; Wang, Fan; Wang, Naiyin; Fu, Lan; He, Jun; Tan, Hark Hoe; Jagadish, Chennupati.
Affiliation
  • Yuan X; School of Physics and Electronics, Hunan Key Laboratory for Supermicrostructure and Ultrafast Process, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China. xiaoming.yuan@csu.edu.cn fan.wang@uts.edu.au.
Nanoscale ; 11(18): 9207-9215, 2019 May 09.
Article in En | MEDLINE | ID: mdl-31038526
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: Nanoscale Year: 2019 Type: Article
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: Nanoscale Year: 2019 Type: Article