Controllable Thickness Inhomogeneity and Berry Curvature Engineering of Anomalous Hall Effect in SrRuO<sub>3</sub> Ultrathin Films.

Controllable Thickness Inhomogeneity and Berry Curvature Engineering of Anomalous Hall Effect in SrRuO₃ Ultrathin Films.

Wang, Lingfei; Feng, Qiyuan; Lee, Han Gyeol; Ko, Eun Kyo; Lu, Qingyou; Noh, Tae Won.

Affiliation

Wang L; Center for Correlated Electron Systems (CCES), Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.
Feng Q; Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea.
Lee HG; Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory and High Magnetic Field Laboratory of Anhui Province, Chinese Academy of Sciences, Hefei, Anhui 230031, China.
Ko EK; Center for Correlated Electron Systems (CCES), Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.
Lu Q; Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea.
Noh TW; Center for Correlated Electron Systems (CCES), Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.

Nano Lett ; 20(4): 2468-2477, 2020 Apr 08.

Article in En | MEDLINE | ID: mdl-32202801