Your browser doesn't support javascript.
loading
Calibrated microwave reflectance in low-temperature scanning tunneling microscopy.
Wit, Bareld; Gramse, Georg; Müllegger, Stefan.
Affiliation
  • Wit B; Institute of Semiconductor and Solid State Physics, Johannes Kepler University Linz, 4040 Linz, Austria.
  • Gramse G; Biophysics Institute, Johannes Kepler University, 4020 Linz, Austria.
  • Müllegger S; Institute of Semiconductor and Solid State Physics, Johannes Kepler University Linz, 4040 Linz, Austria.
Rev Sci Instrum ; 94(10)2023 Oct 01.
Article in En | MEDLINE | ID: mdl-37796095
Fulltext
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2023 Type: Article Affiliation country: Austria
Fulltext
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2023 Type: Article Affiliation country: Austria