Aberration Correction for Large-Angle Illumination Scanning Transmission Electron Microscopy by Using Iterative Electron Ptychography Algorithms.
Microsc Microanal
; 30(2): 226-235, 2024 Apr 29.
Article
in En
| MEDLINE
| ID: mdl-38578297
ABSTRACT
Modern aberration correctors in the scanning transmission electron microscope (STEM) have dramatically improved the attainable spatial resolution and enabled atomical structure and spectroscopic analysis even at low acceleration voltages (≤80â
kV). For a large-angle illumination, achieving successful aberration correction to high angles is challenging with an aberration corrector, which limits further improvements in applications such as super-resolution, three-dimensional atomic depth resolution, or atomic surface morphology analyses. Electron ptychography based on four-dimensional STEM can provide a postprocessing strategy to overcome the current technological limitations. In this work, we have demonstrated that aberration correction for large-angle illumination is feasible by pushing the capabilities of regularized ptychographic iterative engine algorithms to reconstruct 4D data sets acquired using a relatively low-efficiency complementary metal oxide semiconductor camera. We report super resolution (0.71â
Å) with large-angle illumination (50-60â
mrad) and under 60â
kV accelerating voltage.
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Microsc Microanal
/
Microsc. microanal
/
Microscopy and microanalysis
Year:
2024
Type:
Article
Affiliation country:
China