Angstrom-Resolved Interfacial Structure in Buried Organic-Inorganic Junctions.
Phys Rev Lett
; 127(9): 096801, 2021 Aug 27.
Article
en En
| MEDLINE
| ID: mdl-34506179
ABSTRACT
Charge transport processes at interfaces play a crucial role in many processes. Here, the first soft x-ray second harmonic generation (SXR SHG) interfacial spectrum of a buried interface (boron-Parylene N) is reported. SXR SHG shows distinct spectral features that are not observed in x-ray absorption spectra, demonstrating its extraordinary interfacial sensitivity. Comparison to electronic structure calculations indicates a boron-organic separation distance of 1.9 Å, with changes of less than 1 Å resulting in easily detectable SXR SHG spectral shifts (ca. hundreds of milli-electron volts).
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1
Colección:
01-internacional
Banco de datos:
MEDLINE
Idioma:
En
Revista:
Phys Rev Lett
Año:
2021
Tipo del documento:
Article
País de afiliación:
Estados Unidos