Imaging Ultrafast Dynamical Diffraction Wave Fronts in Strained Si with Coherent X Rays.
Phys Rev Lett
; 127(15): 157402, 2021 Oct 08.
Article
en En
| MEDLINE
| ID: mdl-34677993
ABSTRACT
Dynamical diffraction effects in thin single crystals produce highly monochromatic parallel x-ray beams with a mutual separation of a few microns and a time delay of a few femtoseconds-the so-called echoes. This ultrafast diffraction effect is used at X-Ray Free Electron Lasers in self-seeding schemes to improve beam monochromaticity. Here, we present a coherent x-ray imaging measurement of echoes from Si crystals and demonstrate that a small surface strain can be used to tune their temporal delay. These results represent a first step toward the ambitious goal of strain tailoring new x-ray optics and, conversely, open up the possibility of using ultrafast dynamical diffraction effects to study strain in materials.
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1
Colección:
01-internacional
Banco de datos:
MEDLINE
Idioma:
En
Revista:
Phys Rev Lett
Año:
2021
Tipo del documento:
Article
País de afiliación:
Alemania