Application of self-supervised approaches to the classification of X-ray diffraction spectra during phase transitions.

Sun, Yue; Brockhauser, Sandor; Hegedus, Péter; Plückthun, Christian; Gelisio, Luca; Ferreira de Lima, Danilo Enoque

Sun, Yue; Brockhauser, Sandor; Hegedus, Péter; Plückthun, Christian; Gelisio, Luca; Ferreira de Lima, Danilo Enoque.

Afiliación

Sun Y; Software Engineering Department, Institute of Informatics, University of Szeged, Dugonics tér 13, Szeged, 6720, Hungary. yue.sun@xfel.eu.
Brockhauser S; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany. yue.sun@xfel.eu.
Hegedus P; Software Engineering Department, Institute of Informatics, University of Szeged, Dugonics tér 13, Szeged, 6720, Hungary.
Plückthun C; Center for Materials Science Data, Humboldt-Universität zu Berlin, Zum Großen Windkanal 2, 12489, Berlin, Germany.
Gelisio L; Software Engineering Department, Institute of Informatics, University of Szeged, Dugonics tér 13, Szeged, 6720, Hungary. hpeter@inf.u-szeged.hu.
Ferreira de Lima DE; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.

Sci Rep ; 13(1): 9370, 2023 Jun 09.

Article en En | MEDLINE | ID: mdl-37296300

Asunto(s)

Difracción de Rayos X; Transición de Fase

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Asunto principal: Difracción de Rayos X Idioma: En Revista: Sci Rep Año: 2023 Tipo del documento: Article País de afiliación: Hungria

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