Deformation Rate-Adaptive Conducting Polymers and Composites.

Materials are more easily damaged during accidents that involve rapid deformation. Here, a design strategy is described for electronic materials comprised of conducting polymers that defies this orthodox property, making their extensibility and toughness dynamically adaptive to deformation rates. This counterintuitive property is achieved through a morphology of interconnected nanoscopic core-shell micelles, where the chemical interactions are stronger within the shells than the cores. As a result, the interlinked shells retain material integrity under strain, while the rate of dissociation of the cores controls the extent of micelle elongation, which is a process that adapts to deformation rates. A prototype based on polyaniline shows a 7.5-fold increase in ultimate elongation and a 163-fold increase in toughness when deformed at increasing rates from 2.5 to 10 000% min-1 . This concept can be generalized to other conducting polymers and highly conductive composites to create "self-protective" soft electronic materials with enhanced durability under dynamic movement or deformation.

Local Topological Markers in Odd Spatial Dimensions and Their Application to Amorphous Topological Matter.

Local topological markers, topological invariants evaluated by local expectation values, are valuable for characterizing topological phases in materials lacking translation invariance. The Chern marker-the Chern number expressed in terms of the Fourier transformed Chern character-is an easily applicable local marker in even dimensions, but there are no analogous expressions for odd dimensions. We provide general analytic expressions for local markers for free-fermion topological states in odd dimensions protected by local symmetries: a Chiral marker, a local Z marker which in case of translation invariance is equivalent to the chiral winding number, and a Chern-Simons marker, a local Z_{2} marker characterizing all nonchiral phases in odd dimensions. We achieve this by introducing a one-parameter family P_{ϑ} of single-particle density matrices interpolating between a trivial state and the state of interest. By interpreting the parameter ϑ as an additional dimension, we calculate the Chern marker for the family P_{ϑ}. We demonstrate the practical use of these markers by characterizing the topological phases of two amorphous Hamiltonians in three dimensions: a topological superconductor (Z classification) and a topological insulator (Z_{2} classification).