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Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes.
Liu, Hao; Wolfman, Mark; Karki, Khim; Yu, Young-Sang; Stach, Eric A; Cabana, Jordi; Chapman, Karena W; Chupas, Peter J.
Afiliación
  • Liu H; X-ray Science Division, Advanced Photon Source, Argonne National Laboratory , 9700 South Cass Avenue, Argonne, Illinois 60439, United States.
  • Wolfman M; Department of Chemistry, University of Illinois at Chicago , Chicago, Illinois 60607, United States.
  • Karki K; Center for Function Nanomaterials, Brookhaven National Laboratory , Upton, New York 11973-5000, United States.
  • Yu YS; Department of Chemistry, University of Illinois at Chicago , Chicago, Illinois 60607, United States.
  • Stach EA; Advanced Light Source, Lawrence Berkeley National Laboratory , Berkeley, California 94720, United States.
  • Cabana J; Center for Function Nanomaterials, Brookhaven National Laboratory , Upton, New York 11973-5000, United States.
  • Chapman KW; Department of Chemistry, University of Illinois at Chicago , Chicago, Illinois 60607, United States.
  • Chupas PJ; X-ray Science Division, Advanced Photon Source, Argonne National Laboratory , 9700 South Cass Avenue, Argonne, Illinois 60439, United States.
Nano Lett ; 17(6): 3452-3457, 2017 06 14.
Article en En | MEDLINE | ID: mdl-28548836

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2017 Tipo del documento: Article País de afiliación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2017 Tipo del documento: Article País de afiliación: Estados Unidos