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Experimental phase diagram of zero-bias conductance peaks in superconductor/semiconductor nanowire devices.
Chen, Jun; Yu, Peng; Stenger, John; Hocevar, Moïra; Car, Diana; Plissard, Sébastien R; Bakkers, Erik P A M; Stanescu, Tudor D; Frolov, Sergey M.
Afiliación
  • Chen J; Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260, USA.
  • Yu P; Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260, USA.
  • Stenger J; Department of Physics and Astronomy, West Virginia University, Morgantown, WV 26506, USA.
  • Hocevar M; Institut Néel, CNRS, 38042 Grenoble, France.
  • Car D; Eindhoven University of Technology, 5600 MB Eindhoven, Netherlands.
  • Plissard SR; Centre National de la Recherche Scientifique, LAAS, Université de Toulouse, 31031 Toulouse, France.
  • Bakkers EPAM; Eindhoven University of Technology, 5600 MB Eindhoven, Netherlands.
  • Stanescu TD; QuTech and Kavli Institute of Nanoscience, Delft University of Technology, 2628 CJ Delft, Netherlands.
  • Frolov SM; Department of Physics and Astronomy, West Virginia University, Morgantown, WV 26506, USA.
Sci Adv ; 3(9): e1701476, 2017 09.
Article en En | MEDLINE | ID: mdl-28913432

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Sci Adv Año: 2017 Tipo del documento: Article País de afiliación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Sci Adv Año: 2017 Tipo del documento: Article País de afiliación: Estados Unidos