Small dose effect in RADFET with thick gate oxide.

Pejovic, Svetlana M; Pejovic, Milic M; Zivanovic, Milos

Pejovic, Svetlana M; Pejovic, Milic M; Zivanovic, Milos.

Afiliación

Pejovic SM; Clinic for Radiooncology, University of Saarland, Homburg, 66421, Germany.
Pejovic MM; University of Nis, Faculty of Electronic Engineering, Aleksandra Medvedeva 14, 18000, Nis, Serbia. Electronic address: milic.pejovic@elfak.ni.ac.rs.
Zivanovic M; Vinca Institute of Nuclear Science, University of Belgrade, PO Box 522, 11001, Belgrade, Serbia.

Appl Radiat Isot ; 152: 72-77, 2019 Oct.

Article en En | MEDLINE | ID: mdl-31280110

Palabras clave

Absorbed radiation dose; Gamma ray irradiation; RADFET; Room temperature annealing; Threshold voltage shift

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Appl Radiat Isot Asunto de la revista: MEDICINA NUCLEAR / SAUDE AMBIENTAL Año: 2019 Tipo del documento: Article País de afiliación: Alemania

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