Extraordinary-log Universality of Critical Phenomena in Plane Defects.

Sun, Yanan; Hu, Minghui; Deng, Youjin; Lv, Jian-Ping

Sun, Yanan; Hu, Minghui; Deng, Youjin; Lv, Jian-Ping.

Afiliación

Sun Y; Department of Physics, Anhui Key Laboratory of Optoelectric Materials Science and Technology, Key Laboratory of Functional Molecular Solids, Ministry of Education, Anhui Normal University, Wuhu, Anhui 241000, China.
Hu M; Department of Physics, Anhui Key Laboratory of Optoelectric Materials Science and Technology, Key Laboratory of Functional Molecular Solids, Ministry of Education, Anhui Normal University, Wuhu, Anhui 241000, China.
Deng Y; National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026, China.
Lv JP; Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China.

Phys Rev Lett ; 131(20): 207101, 2023 Nov 17.

Article en En | MEDLINE | ID: mdl-38039462

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2023 Tipo del documento: Article País de afiliación: China

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