Your browser doesn't support javascript.
loading
Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study.
Valério, Adriana; Trindade, Fabiane J; Penacchio, Rafaela F S; Cisi, Bria; Damasceno, Sérgio; Estradiote, Maurício B; Rodella, Cristiane B; Ferlauto, Andre S; Kycia, Stefan W; Morelhão, Sérgio L.
Afiliación
  • Valério A; Institute of Physics, University of São Paulo, São Paulo, Brazil.
  • Trindade FJ; Laboratory of Materials for Energy, Engineering, Modelling and Applied Social Sciences Center, Federal University of ABC, Santo André, São Paulo, Brazil.
  • Penacchio RFS; Institute of Physics, University of São Paulo, São Paulo, Brazil.
  • Cisi B; Laboratory of Materials for Energy, Engineering, Modelling and Applied Social Sciences Center, Federal University of ABC, Santo André, São Paulo, Brazil.
  • Damasceno S; Laboratory of Materials for Energy, Engineering, Modelling and Applied Social Sciences Center, Federal University of ABC, Santo André, São Paulo, Brazil.
  • Estradiote MB; Institute of Physics, University of São Paulo, São Paulo, Brazil.
  • Rodella CB; Brazilian Synchrotron Light Laboratory - SIRIUS/CNPEM, Campinas, São Paulo, Brazil.
  • Ferlauto AS; Laboratory of Materials for Energy, Engineering, Modelling and Applied Social Sciences Center, Federal University of ABC, Santo André, São Paulo, Brazil.
  • Kycia SW; Department of Physics, University of Guelph, Guelph, Ontario, Canada.
  • Morelhão SL; Institute of Physics, University of São Paulo, São Paulo, Brazil.
J Appl Crystallogr ; 57(Pt 3): 793-807, 2024 Jun 01.
Article en En | MEDLINE | ID: mdl-38846767
ABSTRACT
Controlling the shape and size dispersivity and crystallinity of nanoparticles (NPs) has been a challenge in identifying these parameters' role in the physical and chemical properties of NPs. The need for reliable quantitative tools for analyzing the dispersivity and crystallinity of NPs is a considerable problem in optimizing scalable synthesis routes capable of controlling NP properties. The most common tools are electron microscopy (EM) and X-ray scattering techniques. However, each technique has different susceptibility to these parameters, implying that more than one technique is necessary to characterize NP systems with maximum reliability. Wide-angle X-ray scattering (WAXS) is mandatory to access information on crystallinity. In contrast, EM or small-angle X-ray scattering (SAXS) is required to access information on whole NP sizes. EM provides average values on relatively small ensembles in contrast to the bulk values accessed by X-ray techniques. Besides the fact that the SAXS and WAXS techniques have different susceptibilities to size distributions, SAXS is easily affected by NP-NP interaction distances. Because of all the variables involved, there have yet to be proposed methodologies for cross-analyzing data from two techniques that can provide reliable quantitative results of dispersivity and crystallinity. In this work, a SAXS/WAXS-based methodology is proposed for simultaneously quantifying size distribution and degree of crystallinity of NPs. The most reliable easy-to-access size result for each technique is demonstrated by computer simulation. Strategies on how to compare these results and how to identify NP-NP interaction effects underneath the SAXS intensity curve are presented. Experimental results are shown for cubic-like CeO2 NPs. WAXS size results from two analytical procedures are compared, line-profile fitting of individual diffraction peaks in opposition to whole pattern fitting. The impact of shape dispersivity is also evaluated. Extension of the proposed methodology for cross-analyzing EM and WAXS data is possible.
Palabras clave

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: J Appl Crystallogr Año: 2024 Tipo del documento: Article País de afiliación: Brasil

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: J Appl Crystallogr Año: 2024 Tipo del documento: Article País de afiliación: Brasil