Atomic force acoustic microscopy: Influence of the lateral contact stiffness on the elastic measurements.

Atomic force acoustic microscopy is a dynamic technique where the resonances of a cantilever, that has its tip in contact with the sample, are used to quantify local elastic properties of surfaces. Since the contact resonance frequencies (CRFs) monotonically increase with the tip-sample contact stiffness, they are used to evaluate the local elastic properties of the surfaces through a suitable contact mechanical model. The CRFs depends on both, normal and lateral contact stiffness, kN and kS respectively, where the last one is taken either as constant (kS<1), or as zero, leading to uncertainty in the estimation of the elastic properties of composite materials. In this work, resonance spectra for free and contact vibration were used in a finite element analysis of cantilevers to show the influence of kS in the resonance curves due to changes in the kS/kN ratio. These curves have regions for the different vibrational modes that are both, strongly and weakly dependent on kS, and they can be used in a selective manner to obtain a precise mapping of elastic properties.

The effect of C content on the mechanical properties of Ti-Zr coatings.

In this study, Ti-Zr and Ti-Zr-C coatings were deposited at room temperature via pulsed-DC magnetron sputtering. A 70Ti-30Zr at% target and a 99.99% graphite plate were used to deposit samples. In order to modify C content, coatings were deposited at different target powers such as 50, 75 and 100 W. Changes on the structure, microstructure and mechanical properties due to C addition were studied. Results indicate that the as-deposited coatings were partly crystalline and that an increment on C content stabilized α' phase and inhibited the appearance of ω precipitates. Therefore, Ti-Zr-C alloys with C>1.9 at% showed only α' phase whereas the others alloys exhibited α'+ω structures. Hardness values from 12.94 to 34.31 GPa were obtained, whereas the elastic modulus was found between 181.84 and 298 GPa. Finally, a high elastic recovery ratio (0.69-0.87) was observed as a function of composition. The overall properties of these coatings were improved due to C content increment, martensitic α' phase and nanocrystalline grain size (10-16 nm).

Fast frequency sweeping in resonance-tracking SPM for high-resolution AFAM and PFM imaging.

A new resonance-tracking (RT) method using fast frequency sweeping excitation was developed for quantitative scanning probe microscopy (SPM) imaging. This method allows quantitative imaging of elastic properties and ferroelectrical domains with nanoscale resolution at high data acquisition rates. It consists of a commercial AFM system combined with a high-frequency lock-in amplifier, a programmed function generator and a fast data acquisition card. The resonance-tracking method was applied to the atomic force acoustic microscopy (AFAM) and to the piezoresponse force microscopy (PFM) modes. Plots of amplitude versus time and phase versus time for resonant spectra working with different sweeping frequencies were obtained to evaluate the response speed of the lock-in amplifier. It was proved that this resonance-tracking method allows suitable spectral acquisition at a rate of about 5 ms/pixel, which is useful for SPM imaging in a practical scanning time. In order to demonstrate the system performance, images of RT-AFAM for TiN films and RT-PFM for GeTe are shown.