Semiconductor laser confocal microscopy.
Appl Opt
; 33(4): 578-84, 1994 Feb 01.
Article
en En
| MEDLINE
| ID: mdl-20862052
ABSTRACT
A compact scanning microscope that uses a semiconductor laser both to illuminate a specimen and to detect the signal reflected from it is described. It is demonstrated that the spatial filtering performed by the laser detector ensures confocal operation. Two detection regimes, one employing a laser power monitor and the other using the diode junction voltage as a signal, are compared.
Texto completo:
1
Base de datos:
MEDLINE
Idioma:
En
Revista:
Appl Opt
Año:
1994
Tipo del documento:
Article