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Dynamical effects in strain measurements by dark-field electron holography.
Javon, E; Lubk, A; Cours, R; Reboh, S; Cherkashin, N; Houdellier, F; Gatel, C; Hÿtch, M J.
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  • Javon E; CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, F-31055 Toulouse, France; EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
  • Lubk A; CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, F-31055 Toulouse, France; EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; Institute of Structure Physics, Technische Universität Dresden, 01062 Dresden, Germany.
  • Cours R; CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, F-31055 Toulouse, France.
  • Reboh S; CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, F-31055 Toulouse, France; CEA, LETI, Minatec Campus, 17 rue de Martyrs, 38054 Grenoble, France.
  • Cherkashin N; CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, F-31055 Toulouse, France.
  • Houdellier F; CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, F-31055 Toulouse, France.
  • Gatel C; CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, F-31055 Toulouse, France.
  • Hÿtch MJ; CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, F-31055 Toulouse, France.
Ultramicroscopy ; 147: 70-85, 2014 Dec.
Article en En | MEDLINE | ID: mdl-25062040
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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2014 Tipo del documento: Article País de afiliación: Bélgica
Texto completo
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XML
PubMed Links
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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2014 Tipo del documento: Article País de afiliación: Bélgica