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A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process.
Hsu, Meng-Yin; Liao, Chu-Feng; Shih, Yi-Hong; Lin, Chrong Jung; King, Ya-Chin.
Afiliación
  • Hsu MY; Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, 300, Taiwan. myhsu@well.ee.nthu.edu.tw.
  • Liao CF; Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, 300, Taiwan.
  • Shih YH; Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, 300, Taiwan.
  • Lin CJ; Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, 300, Taiwan.
  • King YC; Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, 300, Taiwan. ycking@ee.nthu.edu.tw.
Nanoscale Res Lett ; 12(1): 418, 2017 Dec.
Article en En | MEDLINE | ID: mdl-28622720
This paper reports a novel full logic compatible 4T2R non-volatile static random access memory (nv-SRAM) featuring its self-inhibit data storing mechanism for in low-power/high-speed SRAM application. With compact cell area and full logic compatibility, this new nv-SRAM incorporates two STI-ReRAMs embedded inside the 4T SRAM. Data can be read/write through a cross-couple volatile structure for maintaining fast accessing speed. Data can be non-volatilely stored in new SRAM cell through a unique self-inhibit operation onto the resistive random access memory (RRAM) load, achieving zero static power during data hold.
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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Nanoscale Res Lett Año: 2017 Tipo del documento: Article País de afiliación: Taiwán

Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Nanoscale Res Lett Año: 2017 Tipo del documento: Article País de afiliación: Taiwán