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Directly measuring the structural transition pathways of strain-engineered VO2 thin films.
Evlyukhin, Egor; Howard, Sebastian A; Paik, Hanjong; Paez, Galo J; Gosztola, David J; Singh, Christopher N; Schlom, Darrell G; Lee, Wei-Cheng; Piper, Louis F J.
Afiliación
  • Evlyukhin E; Department of Physics, Applied Physics and Astronomy, Binghamton University, Binghamton, New York 13902, USA. eevlyukh@binghamton.edu lpiper@binghamton.edu.
Nanoscale ; 12(36): 18857-18863, 2020 Sep 28.
Article en En | MEDLINE | ID: mdl-32896856
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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Nanoscale Año: 2020 Tipo del documento: Article
Texto completo
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XML
PubMed Links
Buscar en Google

Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Nanoscale Año: 2020 Tipo del documento: Article