Applying deep learning to defect detection in printed circuit boards via a newest model of you-only-look-once.

Adibhatla, Venkat Anil; Chih, Huan-Chuang; Hsu, Chi-Chang; Cheng, Joseph; Abbod, Maysam F; Shieh, Jiann-Shing

Adibhatla, Venkat Anil; Chih, Huan-Chuang; Hsu, Chi-Chang; Cheng, Joseph; Abbod, Maysam F; Shieh, Jiann-Shing.

Afiliación

Adibhatla VA; Dept. Mechanical Engineering, Yuan Ze University, Chung-Li, Taiwan.
Chih HC; Dept. Advanced manufacturing system, Boardtek Electronics Corporation, Taiwan.
Hsu CC; Dept. Advanced manufacturing system, Boardtek Electronics Corporation, Taiwan.
Cheng J; Dept. Advanced manufacturing system, Boardtek Electronics Corporation, Taiwan.
Abbod MF; Dept. Electronic and Electrical Engineering, Brunel University London, Uxbridge, UK.
Shieh JS; Dept. Mechanical Engineering, Yuan Ze University, Chung-Li, Taiwan.

Math Biosci Eng ; 18(4): 4411-4428, 2021 05 21.

Article en En | MEDLINE | ID: mdl-34198445

Asunto(s)

Inteligencia Artificial; Aprendizaje Profundo; Algoritmos

Palabras clave

YOLO-v5; convolution neural network; deep learning; printed circuit board (PCB)

Texto completo

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Base de datos: MEDLINE Asunto principal: Inteligencia Artificial / Aprendizaje Profundo Tipo de estudio: Diagnostic_studies Idioma: En Revista: Math Biosci Eng Año: 2021 Tipo del documento: Article País de afiliación: Taiwán

Texto completo

Imprimir

XML

PubMed Links

Buscar en Google