Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection.

Tzu, Fu-Ming; Chen, Jung-Shun; Hsu, Shih-Hsien

Tzu, Fu-Ming; Chen, Jung-Shun; Hsu, Shih-Hsien.

Afiliación

Tzu FM; Department of Marine Engineering, National Kaohsiung University of Science and Technology, Kaohsiung 80543, Taiwan.
Chen JS; Department of Industrial Technology Education, National Kaohsiung Normal University, Kaohsiung 80201, Taiwan.
Hsu SH; Department of Electrical Engineering, Feng Chia University, Taichung 40724, Taiwan.

Micromachines (Basel) ; 12(8)2021 Aug 15.

Article en En | MEDLINE | ID: mdl-34442586

Palabras clave

array tester; optical inspection; optoelectronic apparatus; thin-film-transistor liquid-crystal display (TFT-LCD); time delay integration charge-coupled device (TDI-CCD)

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Texto completo: 1 Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Micromachines (Basel) Año: 2021 Tipo del documento: Article País de afiliación: Taiwán

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