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Nondestructive Imaging of Manufacturing Defects in Microarchitected Materials.
Blankenship, Brian W; Meier, Timon; Arvin, Sophia Lafia; Li, Jingang; Seymour, Nathan; De La Torre, Natalia; Hsu, Brian; Zhao, Naichen; Mavrikos, Stefanos; Li, Runxuan; Grigoropoulos, Costas P.
Afiliación
  • Blankenship BW; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • Meier T; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • Arvin SL; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • Li J; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • Seymour N; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • De La Torre N; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • Hsu B; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • Zhao N; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • Mavrikos S; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • Li R; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
  • Grigoropoulos CP; Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
ACS Appl Eng Mater ; 2(7): 1737-1742, 2024 Jul 26.
Article en En | MEDLINE | ID: mdl-39086613
ABSTRACT
Defects in microarchitected materials exhibit a dual nature, capable of both unlocking innovative functionalities and degrading their performance. Specifically, while intentional defects are strategically introduced to customize and enhance mechanical responses, inadvertent defects stemming from manufacturing errors can disrupt the symmetries and intricate interactions within these materials. In this study, we demonstrate a nondestructive optical imaging technique that can precisely locate defects inside microscale metamaterials, as well as provide detailed insights on the specific type of defect.
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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: ACS Appl Eng Mater Año: 2024 Tipo del documento: Article País de afiliación: Estados Unidos
Texto completo
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XML
PubMed Links
Buscar en Google

Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: ACS Appl Eng Mater Año: 2024 Tipo del documento: Article País de afiliación: Estados Unidos