Accounting for hardware imperfections in EIT image reconstruction algorithms.
Physiol Meas
; 28(7): S13-27, 2007 Jul.
Article
em En
| MEDLINE
| ID: mdl-17664631
Electrical impedance tomography (EIT) is a non-invasive technique for imaging the conductivity distribution of a body section. Different types of EIT images can be reconstructed: absolute, time difference and frequency difference. Reconstruction algorithms are sensitive to many errors which translate into image artefacts. These errors generally result from incorrect modelling or inaccurate measurements. Every reconstruction algorithm incorporates a model of the physical set-up which must be as accurate as possible since any discrepancy with the actual set-up will cause image artefacts. Several methods have been proposed in the literature to improve the model realism, such as creating anatomical-shaped meshes, adding a complete electrode model and tracking changes in electrode contact impedances and positions. Absolute and frequency difference reconstruction algorithms are particularly sensitive to measurement errors and generally assume that measurements are made with an ideal EIT system. Real EIT systems have hardware imperfections that cause measurement errors. These errors translate into image artefacts since the reconstruction algorithm cannot properly discriminate genuine measurement variations produced by the medium under study from those caused by hardware imperfections. We therefore propose a method for eliminating these artefacts by integrating a model of the system hardware imperfections into the reconstruction algorithms. The effectiveness of the method has been evaluated by reconstructing absolute, time difference and frequency difference images with and without the hardware model from data acquired on a resistor mesh phantom. Results have shown that artefacts are smaller for images reconstructed with the model, especially for frequency difference imaging.
Buscar no Google
Base de dados:
MEDLINE
Assunto principal:
Algoritmos
/
Computadores
/
Tomografia
/
Impedância Elétrica
/
Modelos Biológicos
Idioma:
En
Ano de publicação:
2007
Tipo de documento:
Article
País de afiliação:
Canadá