Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials.
Opt Express
; 24(7): 7019-27, 2016 Apr 04.
Article
em En
| MEDLINE
| ID: mdl-27136995
ABSTRACT
We study the intensity spatial correlation function of optical speckle patterns above a disordered dielectric medium in the multiple scattering regime. The intensity distributions are recorded by scanning near-field optical microscopy (SNOM) with sub-wavelength spatial resolution at variable distances from the surface in a range which spans continuously from the near-field (distance ⪠λ) to the far-field regime (distance â« λ). The non-universal behavior at sub-wavelength distances reveals the connection between the near-field speckle pattern and the internal structure of the medium.
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MEDLINE
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En
Ano de publicação:
2016
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Article