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Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test.
Kim, Se Young; Park, Hahyeon; Kim, Hongbum; Kim, Joon; Seo, Kyoungwon.
Afiliação
  • Kim SY; Department of Applied Artificial Intelligence, Seoul National University of Science and Technology, 232 Gongneung-ro, Gongneung-dong, Nowon-gu, Seoul 01811, Republic of Korea.
  • Park H; Department of Applied Artificial Intelligence, Seoul National University of Science and Technology, 232 Gongneung-ro, Gongneung-dong, Nowon-gu, Seoul 01811, Republic of Korea.
  • Kim H; College of Business, Gachon University, Gyeonggi-do, Republic of Korea.
  • Kim J; Korea Institute of Industrial Technology, Gyeonggi-do, Republic of Korea.
  • Seo K; Department of Applied Artificial Intelligence, Seoul National University of Science and Technology, 232 Gongneung-ro, Gongneung-dong, Nowon-gu, Seoul 01811, Republic of Korea.
Inf Process Manag ; 59(6): 103093, 2022 Nov.
Article em En | MEDLINE | ID: mdl-36119755

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article