Counting on the future: fast charge-integrating detectors for X-ray nanoimaging.

Deng, Junjing; Miceli, Antonino; Jacobsen, Chris

Deng, Junjing; Miceli, Antonino; Jacobsen, Chris.

Afiliação

Deng J; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
Miceli A; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
Jacobsen C; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.

J Synchrotron Radiat ; 30(Pt 5): 859-860, 2023 Sep 01.

Article em En | MEDLINE | ID: mdl-37610346

ABSTRACT

ABSTRACT

A fast charge-integrating detector has been showcased for high-resolution X-ray ptychography. The advancement in developing detectors of this kind, with rapid framing capabilities, holds paramount significance in harnessing the full potential of emerging diffraction-limited synchrotron sources for X-ray nanoimaging.

Palavras-chave

X-ray nanoimaging; coherent diffraction imaging; commentary; fast charge-integrating detectors

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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos

Texto completo

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PubMed Links

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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos