Influence of Cementation on the Aesthetical Appearance of Full-Ceramic Restorations.

The use of dental ceramics as restorative materials requires corresponding luting materials (cements) that, in turn, influence the visual appearance of the restoration. Due to the high light transmission through the ceramics, the cements can affect the color perception of the dental restoration. This study aims to investigate the optical effects of various cements on the visual appearance of full-ceramic restorations. Three fixing polymer resins (Bifix SE (VOCO GmbH, Cuxhafen, Germany), BreezeTM (Pentron Clinical, West Collins Orange, CA, USA), and PanaviaTM F. 2.0 (Kuraray, Noritake, Osaka, Japan)), with layer thicknesses of 50, 100, 200, and 250 µm, were applied onto a ceramic base model (0.4 mm thick), and irradiated with laser light of wavelengths 532, 632.8, and 1064 nm. Light intensities and scattering effects of light of various wavelengths were angle-dependent, analyzed using a goniophotometer with perpendicular light incidence on the sample specimen (base model plus luting material). In addition, the transmitted power of the light through the sample specimen was determined as a function of the layer thickness. With increasing layer thickness, power losses of respectively 30% for Bifix SE and BreezeTM in the visible spectral range were comparable, whereas PanaviaTM F. 2.0 showed a power loss of ca. 44% here. For the near-infrared range, the power losses for all cements were 25%. This could be confirmed by the interpretation of the line widths. Moreover, the line widths for thin cement layer thicknesses (50 and 100 µm) in the visible spectral range displayed only a redistribution of light by scattering, which does not affect color perception at all. In addition, at 200 and 250 µm, absorption occurred which causes a change in color perception. Within the scope of this study, it could be shown that for thin-layer thicknesses of the cement applied here, there is no adverse optical effect on the aesthetic visual appearance of the restoration.

Perspective: Biochemical and Physical Constraints Associated With Preparing Thin Specimens for Single-Particle Cryo-EM.

While many aspects of single-particle electron cryo-microscopy (cryo-EM) of biological macromolecules have reached a sophisticated level of development, this is not yet the case when it comes to preparing thin samples on specimen grids. As a result, there currently is considerable interest in achieving better control of both the sample thickness and the amount of area that is useful, but this is only one aspect in which improvement is needed. This Perspective addresses the further need to prevent the macromolecular particles from making contact with the air-water interface, something that can result in preferential orientation and even structural disruption of macromolecular particles. This unwanted contact can occur either as the result of free diffusion of particles during the interval between application, thinning and vitrification of the remaining buffer, or-when particles have been immobilized-by the film of buffer becoming too thin prior to vitrification. An opportunity now exists to apply theoretical and practical insights from the fields of thin-film physical chemistry and interfacial science, in an effort to bring cryo-EM sample preparation to a level of sophistication that is comparable to that of current data collection and analysis.

Controllable Topological Magnetic Transformations in the Thickness-Tunable van der Waals Ferromagnet Fe5GeTe2.

Recent observations of topological meron textures in two-dimensional (2D) van der Waals (vdW) magnetic materials have attracted considerable research interest for both fundamental physics and spintronic applications. However, manipulating the meron textures and realizing the topological transformations, which allow for exploring emergent electromagnetic behaviors, remain largely unexplored in 2D magnets. In this work, utilizing real-space imaging and micromagnetic simulations, we reveal temperature- and thickness-dependent topological magnetic transformations among domain walls, meron textures, and stripe domain in Fe5GeTe2 (FGT) lamellae. The key mechanism of the magnetic transformations can be attributed to the temperature-induced change of exchange stiffness constant within layers and uniaxial magnetic anisotropy, while the magnetic dipole interaction as governed by sample thickness is crucial to affect the critical transformation temperature and stripe period. Our findings provide reliable insights into the origin and manipulation of topological spin textures in 2D vdW ferromagnets.

Origin of spurious intensity in vacuum near sample edge in bright field TEM images.

Bright-field transmission electron microscope (BFTEM) images exhibit spurious image intensity in the vacuum near the sample edge. The spurious intensity gradually decreases with increasing distance from the sample edge. By taking into account angular and energy loss distribution of the scattered electrons and lens aberrations, the origin of the spurious intensity of BFTEM images can be explained. The spurious intensity extent and magnitude can be significantly reduced by using either electron energy filtering or a small collection semiangle.

Optimized cryo-EM data-acquisition workflow by sample-thickness determination.

Sample thickness is a known key parameter in cryo-electron microscopy (cryo-EM) and can affect the amount of high-resolution information retained in the image. Yet, common data-acquisition approaches in single-particle cryo-EM do not take it into account. Here, it is demonstrated how the sample thickness can be determined before data acquisition, allowing the identification of optimal regions and the restriction of automated data collection to images with preserved high-resolution details. This quality-over-quantity approach almost entirely eliminates the time- and storage-consuming collection of suboptimal images, which are discarded after a recorded session or during early image processing due to a lack of high-resolution information. It maximizes the data-collection efficiency and lowers the electron-microscopy time required per data set. This strategy is especially useful if the speed of data collection is restricted by the microscope hardware and software, or if microscope access time, data transfer, data storage and computational power are a bottleneck.

Further discussion on the separation of linear and nonlinear components in HRTEM imaging.

A method for separating linear and nonlinear components in high-resolution transmission electron microscope imaging has been reported by Chang (Microscopy, 2016. 65: p. 465-472), and a deep understanding has been obtained as to the variation of the linear and nonlinear components with the sample thickness. However, the images used for the separation in the abovementioned study are simulated under ideal conditions, without considering errors in experiments. Therefore, in this study, to verify the practicability of the abovementioned method, experimental details will be systematically considered, such as image mismatch, inaccuracy of the spherical aberration, focus, and residual highfold aberrations A2, B2 etc., based on the AlN simulated image, to determine the margin of error of the abovementioned parameters and provide theoretical guidance for experiments.

A review of sample thickness effects on high-resolution transmission electron microscopy imaging.

High-resolution transmission electron microscopy (HRTEM) is an important approach to analyzing material structures. However, in reality, preparing a sufficiently thin sample for use in HRTEM, based on which images could be interpreted by weak phase object approximation theory, is difficult. During the imaging process, the thickness of the sample has two primary effects-a dynamical effect and a non-linear effect. Both are reviewed in this paper. Considering only the dynamical effect, the Bloch wave method and multislice theory have been proposed to understand the relationship between sample thickness and imaging. These methods exhibit high accuracy but high complexity as well. Sacrificing accuracy, pseudo-weak phase object approximation (PWPOA) theory can provide clues to the relationship in reciprocal space with greater simplicity. Meanwhile, in real space, channeling theory describes the dynamical effect with sufficient accuracy, and with the 1s state approximation, i.e., for a certain range of thicknesses, it provides a physical image and simplified expression with which to describe the relationship between the exit wave and sample thickness. As for the non-linear effect, a method of separating linear and non-linear information using a combination of transmission cross-coefficient theory and PWPOA theory was recently proposed. The variation of non-linear and linear imaging with sample thickness has also been discussed. A deep understanding has been acquired regarding the effects of the sample thickness, but a complete understanding of the HRTEM imaging process for thick samples has remained elusive. This understanding is crucial to the retrieval of structure from HRTEM images.

Solid Parahydrogen Thickness Revisited.

We report updated infrared (IR) absorption measurements on vapor-deposited cryogenic parahydrogen (pH2) solids that indicate a ≈10% systematic error in our previous approach for determining a pH2 solid's thickness (S. Tam and M.E. Fajardo. Appl. Spectrosc. 2001. 55(12): 1634-1644). We provide corrected values for the integrated absorption intensities of the Q1(0)+S0(0) and S1(0)+S0(0) bands calculated over the 4495-4520 cm-1 and 4825-4855 cm-1 regions, respectively. New polarized IR absorption spectroscopy data demonstrate the insensitivity to polarization effects of the peak intensity of the QR(0) phonon sideband near 4228 cm-1. This feature provides an even quicker way for determining the thickness of a pH2 solid than via the integrated absorptions.

Thickness-Dependent DC Electrical Breakdown of Polyimide Modulated by Charge Transport and Molecular Displacement.

Polyimide has excellent electrical, thermal, and mechanical properties and is widely used as a dielectric material in electrical equipment and electronic devices. However, the influencing mechanism of sample thickness on electrical breakdown of polyimide has not been very clear until now. The direct current (DC) electrical breakdown properties of polyimide as a function of thickness were investigated by experiments and simulations of space charge modulated electrical breakdown (SCEB) model and charge transport and molecular displacement modulated (CTMD) model. The experimental results show that the electrical breakdown field decreases with an increase in the sample thickness in the form of an inverse power function, and the inverse power index is 0.324. Trap properties and carrier mobility were also measured for the simulations. Both the simulation results obtained by the SCEB model and the CTMD model have the inverse power forms of breakdown field as a function of thickness with the power indexes of 0.030 and 0.339. The outputs of the CTMD model were closer to the experiments. This indicates that the displacement of a molecular chain with occupied deep traps enlarging the free volume might be a main factor causing the DC electrical breakdown field of polyimide varying with sample thickness.

Thickness Resonance Acoustic Microscopy for Nanomechanical Subsurface Imaging.

A nondestructive scanning near-field thickness resonance acoustic microscopy (SNTRAM) has been developed that provides high-resolution mechanical depth sensitivity and sharp phase contrast of subsurface features. In SNTRAM technology, we excited the sample at its thickness resonance, at which a sharp change in phase is observed and mapped with a scanning probe microscopy stage in near field to provide nanometer-scale nanomechanical contrast of subsurface features/defects. We reported here the remarkable subsubsurface phase contrast and sensitivity of SNTRAM by exciting the sample with a sinusoidal elastic wave at a frequency equal to the thickness resonance of the sample. This results in a large shift in phase component associated with the bulk longitudinal wave propagating through the sample thickness, thus suggesting the usefulness of this method for (a) generating better image contrast due to high S/N of the transmitted ultrasound wave to the other side of the sample and (b) sensitive detection of local variation in material properties at much better resolution due to the sharp change in phase. We demonstrated that the sample excited at the thickness resonance has a more substantial phase contrast and depth sensitivity than that excited at off-resonance and related acoustic techniques. Subsurface features down to 5-8 nm lateral resolution have been demonstrated using a standard sample.

Practical aspects of the use of the X(2) holder for HRTEM-quality TEM sample preparation by FIB.

The X(2) holder enables the effective production of thin, electron transparent samples for high-resolution transmission electron microscopy (HRTEM). Improvements to the X(2) holder for high-quality transmission electron microscopy (TEM) sample preparation are presented in this paper. We discuss the influence of backscattered electrons (BSE) from the sample holder in determining the lamella thickness in situ and demonstrate that a significant improvement in thickness determination can be achieved by comparatively simple means using the relative BSE intensity. We show (using Monte Carlo simulations) that by taking into account the finite collection angle of the electron backscatter detector, an approximately 20% underestimation of the lamella thickness in a silicon sample can be avoided. However, a correct thickness determination for light-element lamellas still remains a problem with the backscatter method; we introduce a more accurate method using the energy dispersive X-ray spectroscopy (EDX) signal for in situ thickness determination. Finally, we demonstrate how to produce a thin lamella with a nearly damage-free surface using the X(2) holder in combination with sub-kV polishing in the Fischione Instruments׳ NanoMill(®) TEM specimen preparation system.

Combined effects of sample parameters on polymer charging due to electron irradiation: a contour simulation.

Combined effects of sample parameters on polymer charging due to electron irradiation are explored by a novel approach of contour in parallel computing. Transient processes of negative charging of a Kapton film sample irradiated by 10 keV electrons are simulated with a simultaneous scattering-transport model and the existing experimental secondary electron current. As a function of sample thickness and electron mobility, the contour maps are then presented of the steady-state leakage current and surface potential and the total charge accumulated in a charging process. It is found that the leakage current and surface potential behave similarly in the contour form, and the total charge has the local maximum with respect to the sample thickness. Generally, the sample thickness affects the charging process more than the electron mobility, but both have less influence in very strong and weak charging states. Accompanied by discussion of charge dissipation effects, this study offers a comprehensive insight into complicated charging phenomena in electron-based surface microscopy, analysis and measurement.