Your browser doesn't support javascript.
loading
Multi-pinhole SPECT calibration: influence of data noise and systematic orbit deviations.
Zhou, Lin; Vunckx, Kathleen; Nuyts, Johan.
Affiliation
  • Zhou L; Department of NuclearMedicine, K. U. Leuven, B-3000 Leuven, Belgium. lin.zhou@uz.kuleuven.be
IEEE Trans Med Imaging ; 30(10): 1795-807, 2011 Oct.
Article in En | MEDLINE | ID: mdl-21536518

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Image Processing, Computer-Assisted / Tomography, Emission-Computed, Single-Photon Type of study: Diagnostic_studies / Prognostic_studies Language: En Journal: IEEE Trans Med Imaging Year: 2011 Type: Article Affiliation country: Belgium

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Image Processing, Computer-Assisted / Tomography, Emission-Computed, Single-Photon Type of study: Diagnostic_studies / Prognostic_studies Language: En Journal: IEEE Trans Med Imaging Year: 2011 Type: Article Affiliation country: Belgium