Multi-pinhole SPECT calibration: influence of data noise and systematic orbit deviations.
IEEE Trans Med Imaging
; 30(10): 1795-807, 2011 Oct.
Article
in En
| MEDLINE
| ID: mdl-21536518
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Main subject:
Image Processing, Computer-Assisted
/
Tomography, Emission-Computed, Single-Photon
Type of study:
Diagnostic_studies
/
Prognostic_studies
Language:
En
Journal:
IEEE Trans Med Imaging
Year:
2011
Type:
Article
Affiliation country:
Belgium