Aberration correction for low voltage optimized transmission electron microscopy.

Bacovský, Jaromír

Bacovský, Jaromír.

Affiliation

Bacovský J; DELONG INSTRUMENTS a.s., Palackého trída 3019/153 b, 612 00 Brno, Czech Republic.

MethodsX ; 5: 1033-1047, 2018.

Article in En | MEDLINE | ID: mdl-30225204

Key words

Aberration corrected low voltage transmission electron micrscopy; Aberration correction; Hexapole corrector; Low voltage transmission electron microscopy

Fulltext

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6138797
https://dx.doi.org/10.1016/j.mex.2018.08.009

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: MethodsX Year: 2018 Type: Article Affiliation country: Czech Republic

Fulltext

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6138797
https://dx.doi.org/10.1016/j.mex.2018.08.009

XML

PubMed Links

Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: MethodsX Year: 2018 Type: Article Affiliation country: Czech Republic