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Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces.
Headrick, Randall L; Ulbrandt, Jeffrey G; Myint, Peco; Wan, Jing; Li, Yang; Fluerasu, Andrei; Zhang, Yugang; Wiegart, Lutz; Ludwig, Karl F.
Affiliation
  • Headrick RL; Department of Physics and Materials Science Program, University of Vermont, Burlington, VT, 05405, USA. rheadrick@uvm.edu.
  • Ulbrandt JG; Department of Physics and Materials Science Program, University of Vermont, Burlington, VT, 05405, USA.
  • Myint P; Division of Materials Science and Engineering, Boston University, Boston, MA, 02215, USA.
  • Wan J; Department of Physics and Materials Science Program, University of Vermont, Burlington, VT, 05405, USA.
  • Li Y; Department of Physics and Materials Science Program, University of Vermont, Burlington, VT, 05405, USA.
  • Fluerasu A; National Synchrotron Light Source II, Upton, NY, 11967, USA.
  • Zhang Y; National Synchrotron Light Source II, Upton, NY, 11967, USA.
  • Wiegart L; National Synchrotron Light Source II, Upton, NY, 11967, USA.
  • Ludwig KF; Division of Materials Science and Engineering, Boston University, Boston, MA, 02215, USA.
Nat Commun ; 10(1): 2638, 2019 06 14.
Article in En | MEDLINE | ID: mdl-31201329
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nat Commun Journal subject: BIOLOGIA / CIENCIA Year: 2019 Type: Article Affiliation country: United States
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nat Commun Journal subject: BIOLOGIA / CIENCIA Year: 2019 Type: Article Affiliation country: United States