Applications of scanning electron microscopy and focused ion beam milling in dental research.
Eur J Oral Sci
; 130(2): e12853, 2022 04.
Article
in En
| MEDLINE
| ID: mdl-35288994
ABSTRACT
The abilities of scanning electron microscopy (SEM) and focused ion beam (FIB) milling for obtaining high-resolution images from top surfaces, cross-sectional surfaces, and even in three dimensions, are becoming increasingly important for imaging and analyzing tooth structures such as enamel and dentin. FIB was originally developed for material research in the semiconductor industry. However, use of SEM/FIB has been growing recently in dental research due to the versatility of dual platform instruments that can be used as a milling device to obtain low-artifact cross-sections of samples combined with high-resolution images. The advent of the SEM/FIB system and accessories may offer access to previously inaccessible length scales for characterizing tooth structures for dental research, opening exciting opportunities to address many central questions in dental research. New discoveries and fundamental breakthroughs in understanding are likely to follow. This review covers the applications, key findings, and future direction of SEM/FIB in dental research in morphology imaging, specimen preparation for transmission electron microscopy (TEM) analysis, and three-dimensional volume imaging using SEM/FIB tomography.
Key words
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Main subject:
Dental Research
/
Dental Enamel
Type of study:
Observational_studies
/
Prevalence_studies
/
Risk_factors_studies
Language:
En
Journal:
Eur J Oral Sci
Journal subject:
ODONTOLOGIA
Year:
2022
Type:
Article
Affiliation country:
United States