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Development of a Stable Cryogenic In Situ Biasing System for Atomic Resolution (S)TEM.
Pivak, Yevheniy; Sun, Hongyu; van Omme, Tijn; Bladt, Eva; Pérez-Garza, H Hugo; Conroy, Michelle; Molina-Luna, Leopoldo.
Affiliation
  • Pivak Y; DENSsolutions, Informaticalaan 12, Delft, TheNetherlands.
  • Sun H; DENSsolutions, Informaticalaan 12, Delft, TheNetherlands.
  • van Omme T; DENSsolutions, Informaticalaan 12, Delft, TheNetherlands.
  • Bladt E; DENSsolutions, Informaticalaan 12, Delft, TheNetherlands.
  • Pérez-Garza HH; DENSsolutions, Informaticalaan 12, Delft, TheNetherlands.
  • Conroy M; Michelle Conroy, Department of Materials, Faculty of Engineering, Imperial College London, London, The United Kingdom.
  • Molina-Luna L; Advanced Electron Microscopy Division (AEM), TU Darmstadt, Darmstadt, Germany.
Microsc Microanal ; 29(Supplement_1): 1695, 2023 Jul 22.
Article in En | MEDLINE | ID: mdl-37613892
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2023 Type: Article
Fulltext
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PubMed Links
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2023 Type: Article