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Fluctuation Electron Microscopy on Amorphous Silicon and Amorphous Germanium.
Radic, Drazen; Peterlechner, Martin; Posselt, Matthias; Bracht, Hartmut.
Affiliation
  • Radic D; Institute of Materials Physics, University of Münster, Wilhelm-Klemm-Str. 10, Münster, 48149 North Rhine-Westphalia, Germany.
  • Peterlechner M; Institute of Materials Physics, University of Münster, Wilhelm-Klemm-Str. 10, Münster, 48149 North Rhine-Westphalia, Germany.
  • Posselt M; Ion Induced Nanostructures, Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstraße 400, Dresden, 01328 Saxony, Germany.
  • Bracht H; Institute of Materials Physics, University of Münster, Wilhelm-Klemm-Str. 10, Münster, 48149 North Rhine-Westphalia, Germany.
Microsc Microanal ; 29(2): 477-489, 2023 Apr 05.
Article in En | MEDLINE | ID: mdl-37749731
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2023 Type: Article Affiliation country: Germany
Fulltext
Print
XML
PubMed Links
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2023 Type: Article Affiliation country: Germany