A Digital-Twin Framework for Predicting the Remaining Useful Life of Piezoelectric Vibration Sensors with Sensitivity Degradation Modeling.

Fu, Chengcheng; Gao, Cheng; Zhang, Weifang

Fu, Chengcheng; Gao, Cheng; Zhang, Weifang.

Affiliation

Fu C; School of Energy and Power Engineering, Beihang University, Beijing 100191, China.
Gao C; School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China.
Zhang W; School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China.

Sensors (Basel) ; 23(19)2023 Sep 29.

Article in En | MEDLINE | ID: mdl-37837003

Key words

accelerated degradation model; digital-twin framework; piezoelectric vibration sensor; remaining useful life prediction; sensitivity degradation

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sensors (Basel) Year: 2023 Type: Article Affiliation country: China

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sensors (Basel) Year: 2023 Type: Article Affiliation country: China