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A self-centering and stiffness-controlled MEMS accelerometer.
Jin, Yiming; Ma, Zhipeng; Ye, Ziyi; Li, Mingkang; Zheng, Xudong; Jin, Zhonghe.
Affiliation
  • Jin Y; School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, 310013 China.
  • Ma Z; Key Laboratory of Micro/Nano-Satellite Research of Zhejiang Province, Hangzhou, 310007 PR China.
  • Ye Z; School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, 310013 China.
  • Li M; Key Laboratory of Micro/Nano-Satellite Research of Zhejiang Province, Hangzhou, 310007 PR China.
  • Zheng X; School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, 310013 China.
  • Jin Z; Key Laboratory of Micro/Nano-Satellite Research of Zhejiang Province, Hangzhou, 310007 PR China.
Microsyst Nanoeng ; 10: 11, 2024.
Article in En | MEDLINE | ID: mdl-38261871
ABSTRACT
This paper presents a high-performance MEMS accelerometer with a DC/AC electrostatic stiffness tuning capability based on double-sided parallel plates (DSPPs). DC and AC electrostatic tuning enable the adjustment of the effective stiffness and the calibration of the geometric offset of the proof mass, respectively. A dynamical model of the proposed accelerometer was developed considering both DC/AC electrostatic tuning and the temperature effect. Based on the dynamical model, a self-centering closed loop is proposed for pulling the reference position of the force-to-rebalance (FTR) to the geometric center of DSPP. The self-centering accelerometer operates at the optimal reference position by eliminating the temperature drift of the readout circuit and nulling the net electrostatic tuning forces. The stiffness closed-loop is also incorporated to prevent the pull-in instability of the tuned low-stiffness accelerometer under a dramatic temperature variation. Real-time adjustments of the reference position and the DC tuning voltage are utilized to compensate for the residue temperature drift of the proposed accelerometer. As a result, a novel controlling approach composed of a self-centering closed loop, stiffness-closed loop, and temperature drift compensation is achieved for the accelerometer, realizing a temperature drift coefficient (TDC) of approximately 7 µg/°C and an Allan bias instability of less than 1 µg.
Key words

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsyst Nanoeng Year: 2024 Type: Article

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsyst Nanoeng Year: 2024 Type: Article