Plasma ion source for in situ ion bombardment in a soft x-ray magnetic scattering diffractometer.
Rev Sci Instrum
; 83(5): 053303, 2012 May.
Article
em En
| MEDLINE
| ID: mdl-22667613
ABSTRACT
A new plasma ion source for in situ keV He ion bombardment of solid state samples or thin films was designed and built for ion fluences between 1 × 10(12) and 1 × 10(17) ions/cm(2). The system was designed to be mounted to different diffraction chambers for soft x-ray resonant magnetic scattering. Without breaking the vacuum due to He-ion bombardment, structural and magnetic modifications of the samples can be studied in situ and element specifically.
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1
Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
Rev Sci Instrum
Ano de publicação:
2012
Tipo de documento:
Article
País de afiliação:
Alemanha