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Microscopic origin of electron accumulation in In2O3.
Zhang, K H L; Egdell, R G; Offi, F; Iacobucci, S; Petaccia, L; Gorovikov, S; King, P D C.
Afiliação
  • Zhang KH; Department of Chemistry, University of Oxford, Inorganic Chemistry Laboratory, South Parks Road, Oxford OX1 3QR, United Kingdom.
Phys Rev Lett ; 110(5): 056803, 2013 Feb 01.
Article em En | MEDLINE | ID: mdl-23414041
ABSTRACT
Angle-resolved photoemission spectroscopy reveals the presence of a two-dimensional electron gas at the surface of In(2)O(3)(111). Quantized subband states arise within a confining potential well associated with surface electron accumulation. Coupled Poisson-Schrödinger calculations suggest that downward band bending for the conduction band must be much bigger than band bending in the valence band. Surface oxygen vacancies acting as doubly ionized shallow donors are shown to provide the free electrons within this accumulation layer. Identification of the origin of electron accumulation in transparent conducting oxides has significant implications in the realization of devices based on these compounds.
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Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2013 Tipo de documento: Article País de afiliação: Reino Unido
Buscar no Google
Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2013 Tipo de documento: Article País de afiliação: Reino Unido