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High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential.
Uhlig, J; Doriese, W B; Fowler, J W; Swetz, D S; Jaye, C; Fischer, D A; Reintsema, C D; Bennett, D A; Vale, L R; Mandal, U; O'Neil, G C; Miaja-Avila, L; Joe, Y I; El Nahhas, A; Fullagar, W; Gustafsson, F Parnefjord; Sundström, V; Kurunthu, D; Hilton, G C; Schmidt, D R; Ullom, J N.
Afiliação
  • Uhlig J; Department of Chemical Physics, Lund University, Lund, Sweden.
  • Doriese WB; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Fowler JW; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Swetz DS; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Jaye C; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
  • Fischer DA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
  • Reintsema CD; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Bennett DA; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Vale LR; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Mandal U; Department of Chemical Physics, Lund University, Lund, Sweden.
  • O'Neil GC; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Miaja-Avila L; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Joe YI; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • El Nahhas A; Department of Chemical Physics, Lund University, Lund, Sweden.
  • Fullagar W; Department of Chemical Physics, Lund University, Lund, Sweden.
  • Gustafsson FP; Department of Chemical Physics, Lund University, Lund, Sweden.
  • Sundström V; Department of Chemical Physics, Lund University, Lund, Sweden.
  • Kurunthu D; Department of Chemical Physics, Lund University, Lund, Sweden.
  • Hilton GC; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Schmidt DR; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
  • Ullom JN; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
J Synchrotron Radiat ; 22(3): 766-75, 2015 May.
Article em En | MEDLINE | ID: mdl-25931095
ABSTRACT
X-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low efficiency of wavelength-dispersive X-ray spectrometer technology has limited the use of XES, especially in combination with weaker laboratory X-ray sources. More efficient energy-dispersive detectors have either insufficient energy resolution because of the statistical limits described by Fano or too low counting rates to be of practical use. This paper updates an approach to high-resolution X-ray emission spectroscopy that uses a microcalorimeter detector array of superconducting transition-edge sensors (TESs). TES arrays are discussed and compared with conventional methods, and shown under which circumstances they are superior. It is also shown that a TES array can be integrated into a table-top time-resolved X-ray source and a soft X-ray synchrotron beamline to perform emission spectroscopy with good chemical sensitivity over a very wide range of energies.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Synchrotron Radiat Assunto da revista: RADIOLOGIA Ano de publicação: 2015 Tipo de documento: Article País de afiliação: Suécia
Texto completo
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PubMed Links
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Synchrotron Radiat Assunto da revista: RADIOLOGIA Ano de publicação: 2015 Tipo de documento: Article País de afiliação: Suécia