Involvement of flocculin in negative potential-applied ITO electrode adhesion of yeast cells.
FEMS Yeast Res
; 15(6)2015 Sep.
Article
em En
| MEDLINE
| ID: mdl-26187908
ABSTRACT
The purpose of this study was to develop novel methods for attachment and cultivation of specifically positioned single yeast cells on a microelectrode surface with the application of a weak electrical potential. Saccharomyces cerevisiae diploid strains attached to an indium tin oxide/glass (ITO) electrode to which a negative potential between -0.2 and -0.4 V vs. Ag/AgCl was applied, while they did not adhere to a gallium-doped zinc oxide/glass electrode surface. The yeast cells attached to the negative potential-applied ITO electrodes showed normal cell proliferation. We found that the flocculin FLO10 gene-disrupted diploid BY4743 mutant strain (flo10Δ /flo10Δ) almost completely lost the ability to adhere to the negative potential-applied ITO electrode. Our results indicate that the mechanisms of diploid BY4743 S. cerevisiae adhesion involve interaction between the negative potential-applied ITO electrode and the Flo10 protein on the cell wall surface. A combination of micropatterning techniques of living single yeast cell on the ITO electrode and omics technologies holds potential of novel, highly parallelized, microchip-based single-cell analysis that will contribute to new screening concepts and applications.
Palavras-chave
Texto completo:
1
Coleções:
01-internacional
Base de dados:
MEDLINE
Assunto principal:
Saccharomyces cerevisiae
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Moléculas de Adesão Celular
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Adesão Celular
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Proteínas de Saccharomyces cerevisiae
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Eletrodos
Idioma:
En
Revista:
FEMS Yeast Res
Assunto da revista:
MICROBIOLOGIA
Ano de publicação:
2015
Tipo de documento:
Article
País de afiliação:
Japão