Characterization of secondary ion emission processes of sub-MeV C<sub>60</sub> ion impacts via analysis of statistical distributions of the emitted ion number.

Hirata, K; Yamada, K; Chiba, A; Narumi, K; Saitoh, Y

Characterization of secondary ion emission processes of sub-MeV C₆₀ ion impacts via analysis of statistical distributions of the emitted ion number.

Hirata, K; Yamada, K; Chiba, A; Narumi, K; Saitoh, Y.

Afiliação

Hirata K; National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan.
Yamada K; Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology (QST), 1233 Watanuki, Takasaki, Gumma 370-1292, Japan.
Chiba A; Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology (QST), 1233 Watanuki, Takasaki, Gumma 370-1292, Japan.
Narumi K; Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology (QST), 1233 Watanuki, Takasaki, Gumma 370-1292, Japan.
Saitoh Y; Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology (QST), 1233 Watanuki, Takasaki, Gumma 370-1292, Japan.

J Chem Phys ; 145(23): 234311, 2016 Dec 21.

Article em En | MEDLINE | ID: mdl-28010077

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Chem Phys Ano de publicação: 2016 Tipo de documento: Article País de afiliação: Japão

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