Quantitative resonant soft x-ray reflectivity from an organic semiconductor single crystal.
J Chem Phys
; 150(9): 094707, 2019 Mar 07.
Article
em En
| MEDLINE
| ID: mdl-30849915
ABSTRACT
Resonant soft X-ray reflectivity at the carbon K-edge was applied to a trigonal tetracene single crystal. The angular resolved reflectivity was quantitatively simulated describing the tetracene crystal in terms of its dielectric tensor, which was derived from the anisotropic absorption cross section of the single molecule, as calculated by density functional theory. A good agreement was found between the experimental and theoretically predicted reflectivity. This allows us to assess the anisotropic optical constants of the organic material, probed at the carbon K-edge, in relation to the bulk/surface structural and electronic properties of the crystal, through empty energy levels.
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1
Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
J Chem Phys
Ano de publicação:
2019
Tipo de documento:
Article
País de afiliação:
Itália