Twenty-Five-Fold Reduction in Measurement Uncertainty for a Molecular Line Intensity.

Fleisher, Adam J; Adkins, Erin M; Reed, Zachary D; Yi, Hongming; Long, David A; Fleurbaey, Hélène M; Hodges, Joseph T

Fleisher, Adam J; Adkins, Erin M; Reed, Zachary D; Yi, Hongming; Long, David A; Fleurbaey, Hélène M; Hodges, Joseph T.

Afiliação

Fleisher AJ; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA.
Adkins EM; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA.
Reed ZD; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA.
Yi H; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA.
Long DA; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA.
Fleurbaey HM; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA.
Hodges JT; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA.

Phys Rev Lett ; 123(4): 043001, 2019 Jul 26.

Article em En | MEDLINE | ID: mdl-31491247

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Estados Unidos

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google